Reliability issues, such as negative-bias-temperature-instability (NBTI), have become pronounced in the nanometer regime. To model their impacts on transistor performance, PTM is developing compact models to enable circuit level analysis. These models will be scalable with key process parameters and compatible with SPICE simulators.
October 28, 2006:
April 28, 2006:
Last updated 10/28/2006. Questions? Contact us.
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