RELIABILITY


Reliability issues, such as negative-bias-temperature-instability (NBTI), have become pronounced in the nanometer regime. To model their impacts on transistor performance, PTM is developing compact models to enable circuit level analysis. These models will be scalable with key process parameters and compatible with SPICE simulators.


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October 28, 2006: 

April 28, 2006: 

References

 


Last updated 10/28/2006. Questions? Contact us.

Copyright 2005, Nanoscale Integration and Modeling (NIMO) Group, ASU. All rights reserved.